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TDP0500高壓差分探頭

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更新時間:2025-05-16 08:27:00瀏覽次數(shù):168

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產(chǎn)品簡介

TDP1000、TDP0500和P6251高壓差動探頭提供了開關(guān)模式電源(SMPS)、CAN/LIN總線和高速數(shù)字系統(tǒng)設(shè)計所需的出色高速電氣和機(jī)械性能。

詳細(xì)介紹

The TDP1000, TDP0500, and P6251 High-voltage Differential Probes provide excellent high-speed electrical and mechanical performance required for today's Switch Mode Power Supply (SMPS), CAN/LIN Bus, and high-speed digital system designs.

Key performance specifications
  • 1 GHz and 500 MHz probe bandwidth

  • <1 pF differential input capacitance

  • 1 MΩ differential input resistance

  • ±42 v (DC + pk AC) differential input voltage

  • >18 dB CMRR (at 250 MHz 50X attenuation)

Key features
  • Outstanding electrical performance

    • Selectable bandwidth-limiting filters

    • DC reject

  • Versatile DUT connectivity

    • Small compact probe head for probing small geometry circuit elements

    • Straight pin, square pin, solder down, variable pitch standard accessories

    • Robust design for reliability

  • Easy to use

    • Connect directly to the TekProbe™ interface oscilloscopes, or to TekConnect® oscilloscopes using TCA-BNC adapter

    • Connect directly to oscilloscopes with the TekVPI™ probe interface

    • Easy access to scope-displayed probe menu for probe setup control and operating status information

    • Remote GPIB/USB probe control through the oscilloscope

    • AutoZero – zeros out output offset

    • Provides automatic units scaling and readout on the oscilloscope display

    • TDP1000, TDP0500

    • P6251

Applications
  • High-speed switch mode power supply design

  • CAN/LIN bus design

  • Digital design and characterization

  • Manufacturing engineering test

  • Research and development

High-voltage differential probes

The TDP1000, TDP0500, and P6251 High-voltage Differential Probes are specifically designed for use with and direct connection to Tektronix oscilloscopes with either the TekVPI™ probe interface, or TekProbe BNC Interface. These probes achieve high-speed signal acquisition and measurement fidelity by solving three traditional measurement challenges:

 

  • Outstanding Electrical Performance

  • Versatile Device-Under-Test Connectivity

  • Ease of Use


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