主要特性與技術(shù)指標(biāo)

高壓輸出可達(dá) ±40 V，適用于非易失存儲(chǔ)器測(cè)試

每通道支持二電平和三電平脈沖

ALWG 可以靈活地生成任意波形（任意線性波形生成功能），分辨率為 10 ns

高度精確的強(qiáng)勵(lì)電壓與 0.4 mV 分辨率

頻率范圍為 0.1 Hz 至 33 MHz

電壓監(jiān)測(cè)時(shí)間最小值是 5 µs

每個(gè)模塊具有兩個(gè)通道

描述

B1525A 高電壓半導(dǎo)體脈沖發(fā)生器單元（HV-SPGU）專為解決非易失存儲(chǔ)器（NVM）測(cè)試難題而設(shè)計(jì)。

雙通道 HV-SPGU 結(jié)合了 ±40 V 高壓輸出、任意線性波形生成功能（ALWG）和內(nèi)置三態(tài)特性（適用于每個(gè)通道），可將寫入/擦除周期改進(jìn) 15 倍或更高，因而具備的性能。ALWG 特性可以簡(jiǎn)化復(fù)雜波形的生成過(guò)程，無(wú)需編程即可對(duì)幾十萬(wàn)個(gè)周期內(nèi)的波形輕松排序。

Main features and technical indicators

High voltage output up to 40 V, suitable for non-volatile memory testing

Each channel supports two and three level pulses

ALWG can flexibly generate any waveform (any linear waveform generation function) with a resolution of 10 ns

Highly accurate strong excitation voltage and 0.4 mV resolution

The frequency range is 0.1hz to 33mhz

The minimum voltage monitoring time is 5 s

Each module has two channels

describe

The B1525A high voltage semiconductor pulse generator unit (hv-spgu) is designed to solve the problem of non-volatile memory (NVM) testing.

The dual-channel hv-spgu combines a 40 V high voltage output, arbitrary linear waveform generation (ALWG) and built-in three-state features (for each channel) to improve the write/erase cycle by 15 times or more, resulting in unparalleled performance. The ALWG feature simplifies the generation of complex waveforms, allowing easy sequencing of waveforms over hundreds of thousands of cycles without programming.