主要特性與技術(shù)指標(biāo)

硬件支持

支持 2.5 GT/s（Gen1）、5.0 GT/s（Gen2）和 8.0 GT/s（Gen3）速率

鏈路寬度支持 x1 至 x16 通道

標(biāo)準(zhǔn) PCIe 半尺寸卡，適合大多數(shù)平臺

仿真根組件（RC）或附加卡（AIC）

LTSSM 軟件功能

預(yù)定義 LTSSM 測試，可以幫助驗證復(fù)雜且難以測試的被測器件 LTSSM 狀態(tài)轉(zhuǎn)換

詳細的報告能夠明確問題根源，進而實現(xiàn)快速調(diào)試

易于使用的測試體系結(jié)構(gòu)，只需單擊即可運行所有測試

使用 CLKREQ# 信號進行 L1 亞太分析（L1.1 和 L1.2）

NVMe 根組件（RC）仿真

掃描并初始化 NVMe 寄存器、隊列和中斷

配置提交隊列頭、尾指針和完成隊列頭指針

在提交隊列中添加 NVMe 命令，并提交至 NVMe 被測器件。命令作為預(yù)定義模板提供

創(chuàng)建 PRP 列表和 PRP 條目，并用于已提交的 NVMe 數(shù)據(jù)傳輸命令

其他 PCIe 測試

測試臺，可以開發(fā)自動化測試腳本和生成報告

仿真 NVMe 驅(qū)動

支持 TCL、Python 和 C 腳本，可以實現(xiàn)測試自動化

協(xié)議測試卡（PTC）：符合 PCI-SIG 測試標(biāo)準(zhǔn)的測試和驗證

Main Characteristics and Technical Indicators

Hardware support

Support 2.5 GT/s (Gen1), 5.0 GT/s (Gen2) and 8.0 GT/s (Gen3) rates

Link width supports X1 to x16 channels

Standard PCIe half-size card, suitable for most platforms

Simulation Root Component (RC) or Additional Card (AIC)

LTSSM Software Function

Predefined LTSSM testing can help verify the LTSSM state transition of the device under test, which is complex and difficult to test.

Detailed reports can identify the root cause of the problem, and then achieve rapid debugging.

Easy-to-use test architecture that runs all tests with a single click

L1 Asia-Pacific analysis using CLKREQ signal (L1.1 and L1.2)

NVMe Root Component (RC) Simulation

Scan and initialize NVMe registers, queues, and interrupts

Configure the submission queue header, tail pointer and completion queue header pointer

The NVMe commａnd is added to the submission queue and submitted to the device under test. Commands are provided as predefined templates

Create PRP lists and PRP entries and use them for submitted NVMe data transfer commands

Other PCIe tests

Test bench to develop automated test scripts and generate reports

Simulated NVMe Driver

Support TCL, Python and C scripts to achieve test automation

Protocol Test Card (PTC): Testing and Verification in accordance with PCI-SIG Test Standard