主要特性與技術(shù)指標(biāo)

精確的數(shù)據(jù)恢復(fù)和良好的信號(hào)表征

支持 2.5 GT/s（代）、5.0 GT/s（第二代）和 8.0 GT/s（第三代）速率

使用 ESP（均衡探頭）技術(shù)，可確保在全部 3 代平臺(tái)以及所有 x1 至 x16 鏈路寬度上進(jìn)行精確的數(shù)據(jù)恢復(fù)

確保可再現(xiàn)設(shè)計(jì)中的問(wèn)題，插槽界接探測(cè)器探頭能夠提供良好的信號(hào)表征

針對(duì)被測(cè)件兩端點(diǎn)的機(jī)械穩(wěn)定性，并確保固定的 PCIe 插槽連接

描述

用于 PCIe 的是德插槽界接探測(cè)器探頭 3.0 使用 ESP 技術(shù)可確保捕獲的數(shù)據(jù) 99% 精確。

Main Characteristics and Technical Indicators

Accurate data recovery and good signal characterization

Supports 2.5 GT/s (first generation), 5.0 GT/s (second generation) and 8.0 GT/s (third generation) rates

Using ESP (Equilibrium Monitor Probe) technology, accurate data recovery can be ensured on all 3-generation platforms and all x1-x16 link widths.

To ensure the reproducibility of problems in design, the slot boundary detector probe can provide good signal characterization.

Aiming at the mechanical stability of the two ends of the measured part and ensuring the fixed PCIe slot connection

describe

For PCIe, De slot boundary detector probe 3.0 uses ESP technology to ensure 99% accuracy of captured data.